In this iterative test generation method, sequential logic is
A) used in the same pattern
B) converted to test logic
C) converted to combinational logic
D) converted to asynchronous logic
Correct Answer:
Verified
Q7: Which is the delay elements for clocked
Q8: Which contributes to the necessary delay element?
A)flip-flops
B)circuit
Q9: In an OR gate, if A and
Q10: Iterative test generation method suits for circuits
Q11: Which method is very time consuming?
A)d-algorithm
B)iterative test
Q13: For a NAND gate, struck-at 1 fault
Q14: Any condition that causes a processor to
Q15: In this technique, a simple fault manifests
Q16: The contention for the usage of a
Q17: The situation wherein the data of operands
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