Indicate true (T) and false (F) statements below regarding superresolution fluorescence microscopy. Your answer would be a four-letter string composed of letters T and F only, e.g. FFFF.
( ) Resolutions of 5 nm or better can be readily achieved by superresolution fluorescence techniques.
( ) SIM overcomes the limit imposed by the diffraction of light by a computational analysis on images obtained from interference patterns.
( ) PALM and STORM techniques reduce the width (or "spread") of the point spread function.
( ) Success of STED depends on fluorescence probes that are reversibly switched off and on.

Question

Indicate true (T) and false (F) statements below regarding superresolution fluorescence microscopy. Your answer would be a four-letter string composed of letters T and F only, e.g. FFFF.
( )	Resolutions of 5 nm or better can be readily achieved by superresolution fluorescence techniques.
( )	SIM overcomes the limit imposed by the diffraction of light by a computational analysis on images obtained from interference patterns.
( )	PALM and STORM techniques reduce the width (or "spread") of the point spread function.
( )	Success of STED depends on fluorescence probes that are reversibly switched off and on.

Quizplus · Accepted Answer

The highest resolution achieved by superresolution techniques has been about 20 nm, an order of magnitude past the limit set by light diffraction. Different methods overcome the limit in various ways. In structured illumination microscopy (SIM), this is done by using a patterned light source that is translated and rotated with respect to the sample to collect a series of interference images that are then processed. Stimulated emission depletion microscopy (STED) overcomes the limit by changing the shape of the point spread function, whereas localization methods approximate the center of the point spread function by stochastic sampling.

Indicate True (T) and False (F) Statements Below Regarding Superresolution