In an OR gate, if A and B are two inputs and there is struck at 1 fault in B path, then output will be
A) a
B) 0
C) 1
D) b'
Correct Answer:
Verified
Q4: Sequential circuit includes
A)delays
B)feedback
C)delays and feedback from input
Q5: Which constitutes the test vectors in sequential
Q6: Outputs are functions of
A)present state
B)previous state
C)next state
D)present
Q7: Which is the delay elements for clocked
Q8: Which contributes to the necessary delay element?
A)flip-flops
B)circuit
Q10: Iterative test generation method suits for circuits
Q11: Which method is very time consuming?
A)d-algorithm
B)iterative test
Q12: In this iterative test generation method, sequential
Q13: For a NAND gate, struck-at 1 fault
Q14: Any condition that causes a processor to
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